Your search returned 13 records. Click on the hyperlinks to view further details of Titles..
Magazine Name : Ieee Design And Test Of Computers
Year : 2002Volume number : 19Issue:02
Characterizing Substrate Coupling In Deep-Submicron Design(Article) Subject:
The Industry Tend
,
Background
Author:
S. D
Silverstein
J. V
Vargas
page:
04
-
15
Online Testing Approach For Very Deep-Submicron Ics(Article) Subject:
Very Deep -Submicron
Author:
Michele
Favalli
page:
16
-
23
Micro Intertial Measurement System From China(Article) Subject:
Design & Analysis
Author:
C
Dong
Wen
Zhang
page:
16
-
19
A Surface Measurement System From China For Large Antennas(Article) Subject:
Measurement Principle
,
Composition Of The Measurement System
Author:
Y
Jinnouchi
W
Zhang
page:
20
-
22
Transverse Bow Management System From Korea(Article) Subject:
Transversre Bow Measurement System
Author:
Y
Shin
M. G
Kang
S.G.
Choi
page:
23
-
27
Testing For Deep-Submicron Ics:(Article) Subject:
Kinematics Between Rebar And Concrete.
Author:
Z. D
Chen
L
Wei
page:
24
-
33
Smart Plug And Play Sensor(Article) Subject:
Plug And Play Sensor
Author:
D. J
Pottie
page:
28
-
30
Optimizing The Robotic Performance(Article) Subject:
The F/T Sensor Selection Process
Author:
Jannifer
Dwarak
page:
31
-
34
Cmos Circuits With Subvolt Supply Voltages(Article) Subject:
Low Power Design
Author:
M. R
Stan
page:
34
-
43
Computer Controlled Human Operators(Article) Subject:
Introduction
Author:
E. M
Petriu
J
Whale
page:
35
-
44
Image Processing Techniques For Wafer Defect Cluster Identification(Article) Subject:
Electriccity Market
Author:
C. C
Huang
C. C
Wang
page:
44
-
49
Resizing Rules For Mos Analog Design Resuse(Article) Subject:
The Scaling Of
Author:
G
Montorsi
C
Coish
page:
50
-
59
Multilevel Testing For Design Verification Of Embedded Systems(Article) Subject:
Jet
Author:
Stefan
Schulz
page:
60
-
80
